CVSM Bibliography, Entry [ ReBR+2015SPLC ]


Reuling, Dennis; Bürdek, Johannes; Rotärmel, Serge; Lochau, Malte; Kelter, Udo: Fault-based Product-line Testing: Effective Sample Generation Based on Feature-diagram Mutation;
p.131-140 in: Proceedings of the 19th International Conference on Software Product Lines, New York, NY, USA; ACM; 2015
Library Entries: ACM Digital Library
Deskriptoren: CVSM, SPL, PI